APTS uniformity test

Detail

• APTS Basic description

Physics

• Signals (seed signal and matrix signal)
• Cluster size
• Capacitance
• Noise
• Charge collection efficiency

Materials

• Power Supply

Inventory

• DAQ board

• Proximity board
  • APTS-017
• APTS
  • AF15P_W22B32

Method

Experiment Method

• APTS Basic operation
• APTS pulse test
• APTS source test with 55Fe

Analysis Method

• Calibration
• Signal extraction
• Data quality plots
• Data analysis plots

Results

• According to VBB
• Uniformity tests
• Proximity boards and Chips

Unsolved

• Bit flip