경력(Career)

논문(Paper)

• Characterization of analogue Monolithic Active Pixel Sensor test structures implemented in a 65 nm CMOS imaging process

발표(Presentation)

ITS2 WP2

• Threshold fluctuations for calibrating ALPIDE
  • Meeting Material: Threshold fluctuations for ALPIDE
  • Hyperlink: https://indico.cern.ch/event/1476585/